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ISO 15625:2014

Silk — Electronic test method for defects and evenness of raw silk

Apr 29, 2014

General information

90.93     Dec 1, 2023

ISO

ISO/TC 38/SC 23

International Standard

59.080.01  

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Published

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Scope

ISO 15625:2014 specifies a test method for defects and evenness of raw silk by capacitive and optical electronic testers.
It is applicable to raw silk with the yarn size between 13,3 dtex and 76,7 dtex or 12 denier and 69 denier, whether in skein or on cone, soaked or unsoaked.

Life cycle

NOW

PUBLISHED
ISO 15625:2014
90.93 Standard confirmed
Dec 1, 2023