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ISO 16243:2011

Surface chemical analysis — Recording and reporting data in X-ray photoelectron spectroscopy (XPS)

Nov 25, 2011

General information

90.93     Nov 17, 2024

ISO

ISO/TC 201/SC 2

International Standard

71.040.40  

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Scope

ISO 16243:2011 specifies the minimum level of information to be reported by the analyst following the analysis of a test specimen using X‑ray photoelectron spectroscopy (XPS). It includes information that is to be recorded on or in the analytical record.

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PUBLISHED
ISO 16243:2011
90.93 Standard confirmed
Nov 17, 2024