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IEC 60747-14-1:2000 ED1

Semiconductor devices - Part 14-1: Semiconductor sensors - General and classification

Oct 27, 2000

General information

99.60     Jan 21, 2010

IEC

TC 47/SC 47E

International Standard

31.080.01  

English  

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Revised

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Scope

Describes general items concerning the specifications for sensors which are basically made of semiconductor materials, but also applicable to sensors using dielectric or ferroelectric materials.

Life cycle

NOW

WITHDRAWN
IEC 60747-14-1:2000 ED1
99.60 Withdrawal effective
Jan 21, 2010

REVISED BY

PUBLISHED
IEC 60747-14-1:2010 ED2