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IEC 61709:1996 ED1

Electronic components - Reliability - Reference conditions for failure rates and stress models for conversion

Oct 17, 1996

General information

99.60     Jun 24, 2011

IEC

TC 56

International Standard

31.020  

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Scope

Gives guidance on the use of failure rate data for the reliability
prediction of components in electronic equipment. Reference
conditions for failure rate data are specified, so that data from
different sources can be compared. The reference conditions adopted
are typical of the majority of applications of components in
equipment (e.g. telecommunication use, data processing). In this
standard it is assumed that the failure rate used under reference
conditions is specific to the component i.e. it includes the effect
of complexity, technology of the casing, dependence on
manufacturers and the manufacturing process, etc.

Life cycle

PREVIOUSLY

WITHDRAWN
IEC 60863:1986 ED1

NOW

WITHDRAWN
IEC 61709:1996 ED1
99.60 Withdrawal effective
Jun 24, 2011

REVISED BY

WITHDRAWN
IEC 61709:2011 ED2