IEC 61124:1997 ED1

Reliability testing - Compliance tests for constant failure rate and constant failure intensity

Publication date: Jul 30, 1997

General information

Current stage: 99.60 Effective date: Mar 15, 2006

Originator: IEC

Owner: TC 56

Type: International Standard

ICS: 19.02 03.120.30 21.02

Languages: English French

Buying

Status: Revised

PDF - ALL 31,660

Paper - ALL 31,660

CD - ALL 31,660

Language

Language in which you want to receive the document.

Scope

Specifies procedures to test whether an observed value of:

- failure rate;

- failure intensity;

- mean time to failure;

- mean operating time between failures;

complies with a given requirement.

Three types of test plans are prescribed as follows:

- sequential test plans;

- time/failure terminated test plan;

- fixed calendar time/failure terminated test plans.

Cancels and replaces IEC 60605-7, published in 1978, and its amendment 1 (1990), of which its constitutes a technical revision.

Life cycle

PREVIOUSLY

Replaces
IEC 60605-7:1978/AMD1:1990 ED1

Replaces
IEC 60605-7:1978 ED1

NOW

IEC 61124:1997 ED1
99.60 Withdrawal effective
Mar 15, 2006

REVISED BY

IEC 61124:2006 ED2

Preview

Only informative sections of projects are publicly available. To view the full content, you will need to members of the committee. If you are a member, please log in to your account by clicking on the "Log in" button.