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IEC 61000-4-4:1995 ED1

Electromagnetic compatibility (EMC) - Part 4: Testing and measurement techniques - Section 4: Electrical fast transient/burst immunity test. Basic EMC Publication

Jan 18, 1995

General information

99.60     Jul 8, 2004

IEC

TC 77/SC 77B

International Standard

33.100.20  

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Scope

Relates to the immunity requirements and test methods for
electrical and electronic equipment to repetitive electrical fast
transients. Additionally defines ranges of test levels and
establishes test procedures.
The object of this standard is to establish a common and
reproducible basis for evaluating the performance of electrical and
electronic equipment when subjected to repetitive fast transients
(bursts), on supply, signal and control ports.
The test is intended to demonstrate the immunity of electrical and
electronic equipment when subjected to types of transient
disturbances such as those originating from switching transients
(interruption of inductive loads, relay contact bounce, etc.). The
standard defines:

- test voltage waveform;

- range of test levels;

- test equipment;

- test set-up;

- test procedure.

Life cycle

PREVIOUSLY

WITHDRAWN
IEC 60801-4:1988 ED1

NOW

WITHDRAWN
IEC 61000-4-4:1995 ED1
99.60 Withdrawal effective
Jul 8, 2004

CORRIGENDA / AMENDMENTS

WITHDRAWN
IEC 61000-4-4:1995/AMD2:2001 ED1

WITHDRAWN
IEC 61000-4-4:1995/AMD1:2000 ED1

REVISED BY

WITHDRAWN
IEC 61000-4-4:2004 ED2