IEC 60931-2:1995 ED2

Shunt power capacitors of the non-self-healing type for a.c. systems having a rated voltage up to and including 1000 V - Part 2: Ageing test and destruction test

Publication date: Dec 13, 1995

General information

Current stage: 99.60 Effective date: Jun 26, 2025

Originator: IEC

Owner: TC 33

Type: International Standard

ICS: 29.120.99 31.060.70

Languages: English French Spanish

Buying

Status: Revised

PDF - ALL 4,523

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CD - ALL 4,523

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Scope

Applies to capacitors according to IEC 60931-1 and gives the requirements for the ageing test and destruction test for these capacitors. The two ageing test methods are intended to ensure that the capacitor case temperature is maintained constant during the test. The destruction test is performed to evaluate the behaviour of the capacitor at the end of its life.

Life cycle

PREVIOUSLY

WITHDRAWN
IEC 60931-2:1992 ED1

NOW

WITHDRAWN
IEC 60931-2:1995 ED2
99.60 Withdrawal effective
Jun 26, 2025

REVISED BY

PUBLISHED
IEC 60931-2:2025 ED3