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IEC 60060-3:1976 ED1

High-voltage test techniques - Part 3: Measuring devices

Jan 1, 1976

General information

99.60     Nov 30, 1994

IEC

TC 42

International Standard

17.220.20     19.080  

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Scope

Applies to devices and complete systems, other than sphere-gaps, used for the measurement of voltages and currents during dielectric tests with direct voltage, alternating voltage, lightning and switching impulse voltages and for tests with high-impulse currents. Voltage measurements with sphere-gaps are dealt with in IEC 52. Gives guidance concerning the quantities to be measured, accuracies required and requirements of measuring systems.

Life cycle

NOW

WITHDRAWN
IEC 60060-3:1976 ED1
99.60 Withdrawal effective
Nov 30, 1994

REVISED BY

WITHDRAWN
IEC 60060-2:1994 ED2

IN_DEVELOPMENT
IEC 60060-3 ED2