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IEC 60749:1984/AMD2:1993 ED1

Amendment 2 - Semiconductor devices - Mechanical and climatic test methods.

Sep 21, 1993

General information

99.60     Oct 28, 1996

IEC

TC 47

International Standard

31.080.01  

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IEC 60749:1984 ED1

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IEC 60749:1984/AMD2:1993 ED1
99.60 Withdrawal effective
Oct 28, 1996

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IEC 60749:1996 ED2