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IEC 60748-11:1990 ED1

Semiconductor devices - Integrated circuits - Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits

Dec 20, 1990

General information

60.60     Dec 20, 1990

IEC

TC 47/SC 47A

International Standard

31.200  

English   French  

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Published

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Scope

Applies to encapsulated semiconductor integrated circuits, including multichip integrated circuits, but excluding hybrid circuits. Gives details of the Quality Assessment Procedures, the inspection requirements, screening sequences, sampling requirements, test and measurement procedures required for the assessment of semiconductor integrated circuits, including digital, analogue and interface circuits.

Life cycle

NOW

PUBLISHED
IEC 60748-11:1990 ED1
60.60 Standard published
Dec 20, 1990

CORRIGENDA / AMENDMENTS

PUBLISHED
IEC 60748-11:1990/AMD1:1995 ED1

PUBLISHED
IEC 60748-11:1990/AMD2:1999 ED1

National adoptions

SSH IEC 60748-11:1990  
DPS

Semiconductor devices - Integrated circuits - Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits

60.60 Standard published

DPS/KT 7 more