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IEC 60749-5:2017 ED2

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

Apr 10, 2017

General information

99.60     Dec 19, 2023

IEC

TC 47

International Standard

31.080.01  

English   French  

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Revised

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Scope

IEC 60749-5:2017 provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
This second edition cancels and replaces the first edition published in 2003. This edition constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous edition:
a) correction of an error in an equation;
b) inclusion of notes for guidance;
c) clarification of the applicability of test conditions.

Life cycle

PREVIOUSLY

WITHDRAWN
IEC 60749-5:2003 ED1

NOW

WITHDRAWN
IEC 60749-5:2017 ED2
99.60 Withdrawal effective
Dec 19, 2023

REVISED BY

PUBLISHED
IEC 60749-5:2023 ED3