DPS
Drejtoria e Përgjithshme e Standardizimit
0 Items
My account
E-albania
Phone: +355 4 222 62 55
E-mail: info@dps.gov.al
Address: Address: "Reshit Collaku" Str., (nearby ILDKPKI, VI floor), Po.Box 98, Tiranë - Albania
Main menu

IEC 62979:2017 ED1

Photovoltaic modules - Bypass diode - Thermal runaway test

Aug 10, 2017

General information

60.60     Aug 10, 2017

IEC

TC 82

International Standard

27.160  

English   French  

Buying

Published

Language in which you want to receive the document.

Scope

IEC 62979:2017 provides a method for evaluating whether a bypass diode as mounted in the module is susceptible to thermal runaway or if there is sufficient cooling for it to survive the transition from forward bias operation to reverse bias operation without overheating. This test methodology is particularly suited for testing of Schottky barrier diodes, which have the characteristic of increasing leakage current as a function of reverse bias voltage at high temperature, making them more susceptible to thermal runaway.

Life cycle

NOW

PUBLISHED
IEC 62979:2017 ED1
60.60 Standard published
Aug 10, 2017