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IEC TS 62876-2-1:2018 ED1

Nanotechnology - Reliability assessment - Part 2-1: Nano-enabled photovoltaic devices - Stability test

Aug 29, 2018

General information

60.60     Aug 29, 2018

IEC

TC 113

Technical Specification

07.120     27.160  

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Scope

IEC TS 62876-2-1:2018 establishes a general stability testing programme to verify the stability of the performance of nanomaterials and nano-enabled photovoltaic devices (NePV) devices. These devices are used as subassemblies for the fabrication of photovoltaic modules through a combination with other components. This testing programme defines standardized degradation conditions, methodologies and data assessment for technologies. The results of these tests define a stability under standardized degradation conditions for quantitative evaluation of the stability of a new technology. The procedures outlined in this document were designed for NePV, but can be extended to serve as a guideline for other photovoltaic technologies as well.

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PUBLISHED
IEC TS 62876-2-1:2018 ED1
60.60 Standard published
Aug 29, 2018