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IEC PAS 61338-1-5:2010 ED1

Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency

May 19, 2010

General information

99.60     Jun 25, 2015

IEC

TC 49

Publicly Available Specification

31.140  

English  

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Scope

IEC/PAS 61338-1-5:2010(E) describes a measurement method for resistance and effective conductivity at the interface between conductor layer and dielectric substrate.

Life cycle

NOW

WITHDRAWN
IEC PAS 61338-1-5:2010 ED1
99.60 Withdrawal effective
Jun 25, 2015

REVISED BY

PUBLISHED
IEC 61338-1-5:2015 ED1