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IEC 61000-4-20:2003/AMD1:2006 ED1

Amendment 1 - Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides

Publication date: Nov 15, 2006

General information

Current stage: 99.60 Effective date: Aug 31, 2010

Originator: IEC

Owner: TC 77/SC 77B

Type: International Standard

ICS: 33.100.10 33.100.20

Languages: English French Spanish

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Status: Revised

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PREVIOUSLY

WITHDRAWN
IEC 61000-4-20:2003 ED1

NOW

WITHDRAWN
IEC 61000-4-20:2003/AMD1:2006 ED1
99.60 Withdrawal effective
Aug 31, 2010

REVISED BY

WITHDRAWN
IEC 61000-4-20:2010 ED2