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IEC 62373 ED2

Semiconductor devices - Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)

General information

40.00     Oct 2, 2026

CCDV    Nov 20, 2026

IEC

TC 47

International Standard

31.080.30  

Life cycle

PREVIOUSLY

PUBLISHED
IEC 62373:2006 ED1

NOW

IN_DEVELOPMENT
IEC 62373 ED2
40.00 DIS registered
Oct 2, 2026