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IEC 60749-24:2004 ED1

Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST

Mar 9, 2004

General information

60.60     Mar 9, 2004

IEC

TC 47

International Standard

31.080.01  

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Scope

The unbiased highly accelerated stress test is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments. It employs temperature and humidity under non-condensing conditions to accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it.

Life cycle

PREVIOUSLY

WITHDRAWN
IEC 60749:1996 ED2

WITHDRAWN
IEC 60749:1996/AMD1:2000 ED2

WITHDRAWN
IEC 60749:1996/AMD2:2001 ED2

WITHDRAWN
IEC PAS 62336:2002 ED1

NOW

PUBLISHED
IEC 60749-24:2004 ED1
60.60 Standard published
Mar 9, 2004

REVISED BY

IN_DEVELOPMENT
IEC 60749-24 ED2