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IEC 62899-202-13 ED1

Printed electronics - Part 202-13: Materials - Conductive ink - Sheet resistance measurement method for conductive layer in printed and in-mould-electronics

General information

50.20     Jul 31, 2026

PRVD    Sep 11, 2026

IEC

TC 119

International Standard

31.180     87.080  

Scope

IEC 62899-202-13 ED1 specifies a test pattern as well as resistance and thickness measurement methods for the conductive layer in printed and in-mould-electronics.

Life cycle

NOW

IN_DEVELOPMENT
IEC 62899-202-13 ED1
50.20 Proof sent to secretariat or FDIS ballot initiated: 8 weeks
Jul 31, 2026

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