Published
Describes a method to measure the immunity of integrated circuits (IC) in the presence of conducted RF disturbances, e.g. resulting from radiated RF disturbances. This method guarantees a high degree of repeatability and correlation of immunity measurements. This standard establishes a common base for the evaluation of semiconductor devices used in equipment functioning in an environment subject to unwanted radio frequency electromagnetic waves.
PUBLISHED
IEC 62132-4:2006 ED1
60.60
Standard published
Feb 21, 2006
ABANDON
IEC 62132-4 ED2