This part of IEC 63522 defines general conditions for testing along with their appropriate severities and conditions for measurements and tests designed to assess the ability of device under test (DUT) or specimens to perform under expected conditions of transportation, storage and all aspects of operational use.
This document specifies the general condition to be applied for all testing, if not otherwise specified, and provide general guidance which is used in conjunction with all other parts of the IEC 63522 series.
Life cycle
NOW
IN_DEVELOPMENT IEC 63522-0 ED1 50.20
Proof sent to secretariat or FDIS ballot initiated: 8 weeks Jul 17, 2026
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