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IEC PAS 62177:2000 ED1

Highly-accelerated temperature and humidity stress test (HAST)

Aug 24, 2000
95.99 Withdrawal of Standard   Jul 1, 2002

General information

95.99     Jul 1, 2002

IEC

TC 47

Publicly Available Specification

31.080.01  

English  

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Scope

The highly-accelerated temperature and humidity stress test is performed for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments. It employs severe conditions of temperature, humidity, and bias which accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it.

Life cycle

NOW

WITHDRAWN
IEC PAS 62177:2000 ED1
95.99 Withdrawal of Standard
Jul 1, 2002

REVISED BY

WITHDRAWN
IEC 60749-4:2002 ED1