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IEC PAS 62162:2000 ED1

Field-induced charged-device model test method for electrostatic discharge withstand thresholds of microelectronic components

Aug 22, 2000
95.99 Withdrawal of Standard   May 3, 2017

General information

95.99     May 3, 2017

IEC

TC 47

Publicly Available Specification

31.080.01  

English  

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Replaced

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Scope

Describes a uniform method for establishing charged-device model (CDM) electrostatic discharge (ESD) withstand thresholds. All packages semiconductor components, thin film circuits, surface acoustic wave (SAW) components, opto-electronic components, hybrid integrated circuits (HICS), and multi-chip modules (MCMs) containing any of these components are to be evaluated according to this standard. IEC/PAS 62162 will be re-issued in the form of IEC international standard under reference IEC 60748-20.

Life cycle

NOW

WITHDRAWN
IEC PAS 62162:2000 ED1
95.99 Withdrawal of Standard
May 3, 2017

REVISED BY

WITHDRAWN
IEC 60749-28:2017 ED1