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IEC PAS 62161:2000 ED1

Steady state temperature humidity bias life test

Aug 22, 2000
95.99 Withdrawal of Standard   Mar 15, 2003

General information

95.99     Mar 15, 2003

IEC

TC 47

Publicly Available Specification

31.080.01  

English  

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Scope

Aims at evaluating the reliability of nonhermetic packaged solid-state devices in humid environments. Employs conditions of temperature, humidity, and bias which accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it.

Life cycle

NOW

WITHDRAWN
IEC PAS 62161:2000 ED1
95.99 Withdrawal of Standard
Mar 15, 2003

REVISED BY

WITHDRAWN
IEC 60749-5:2003 ED1