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IEC 63185:2020 ED1

Measurement of the complex permittivity for low-loss dielectric substrates balanced-type circular disk resonator method

Dec 8, 2020

General information

60.60     Dec 8, 2020

IEC

TC 46/SC 46F

International Standard

33.120.30  

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Scope

IEC 63185:2020 relates to a measurement method for complex permittivity of a dielectric substrates at microwave and millimeter-wave frequencies. This method has been developed to evaluate the dielectric properties of low-loss materials used in microwave and millimeter-wave circuits and devices. It uses higher-order modes of a balanced-type circular disk resonator and provides broadband measurements of dielectric substrates by using one resonator, where the effect of excitation holes is taken into account accurately on the basis of the mode-matching analysis.

Life cycle

NOW

PUBLISHED
IEC 63185:2020 ED1
60.60 Standard published
Dec 8, 2020

REVISED BY

IN_DEVELOPMENT
IEC 63185 ED2