Published
IEC TR 62396-7:2017 is a technical report which describes a process to account for the effects of atmospheric radiation on electronic equipment. Single event effects (SEE) due to atmospheric radiation are one class of possible failure mechanisms that are addressed in the safety and reliability analyses of electronic equipment and associated functions. This document focuses on electronic components, electronic equipment and associated electronic functions. System level analysis is not addressed in this document. This document is intended to describe an approach to accounting for SEE in electronic equipment design, design review, and it can provide aid in the aerospace certification process.
Replaces
IEC TS 62396-7 ED1
PUBLISHED
IEC TR 62396-7:2017 ED1
60.60
Standard published
Jul 12, 2017
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