SSH EN IEC 63287-2:2023

Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile

Publication date: May 30, 2024

General information

Current stage: 60.60 Effective date: May 30, 2024

Next stage: 95.99

Originator: DPS

Owner: DPS/KT 7

Type: European Norm

ICS: 31.080.01

Languages: English

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Status: Published

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This part of IEC 63287 gives guidelines for the development of reliability qualification plans using the concept of mission profile, based on the environmental conditioning and proposed usage of the product. This document is not intended for military- and space-related applications.

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SSH EN IEC 63287-2:2023
60.60 Standard published
May 30, 2024

SSH EN IEC 63287-2:2023

Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile

General information

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Scope

Life cycle

NOW

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Adopted from EN IEC 63287-2:2023 IDENTICAL

Adopted from IEC 63287-2:2023

Adopted from EN IEC 63287-2:2023