Published
IEC/TR 62433-2-1:2010 covers black box modelling which has the potential to make the modelling of conducted emission very simple, very fast, and can provide complete protection of proprietary information of IC vendors. This technical report is intended to provide the theoretical background on black box modelling for IC conducted emission.
PUBLISHED
DS IEC TR 62433-2-1:2010 ED1
60.60
Standard published
Sep 7, 2023
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