SSH EN ISO 12179:2022

Geometrical product specifications (GPS) - Surface texture: Profile method - Calibration of contact (stylus) instruments (ISO/FDIS 12179:2021)

Publication date: Jun 7, 2023

General information

Current stage: 60.60 Effective date: Jun 7, 2023

Originator: DPS

Owner: DPS/KT 12

Type: European Norm

ICS: 17.040.30

Languages: English

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Status: Published

PDF - ALL 3,570

Paper - ALL 3,570

CD - ALL 3,570

PDF and Paper - ALL 7,140

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Scope

This document specifies the calibration and adjustment of the metrological characteristics of contact (stylus) instruments for the measurement of surface texture by the profile method as defined in ISO 3274. The calibration and adjustment is intended to be carried out with the aid of measurement standards. Annex B specifies the calibration and adjustment of metrological characteristics of simplified operator contact (stylus) instruments which do not conform with ISO 3274.

Life cycle

PREVIOUSLY

Replaces
SSH EN ISO 12179:2000

Replaces
SSH EN ISO 12179:2000/AC:2008

NOW

PUBLISHED
SSH EN ISO 12179:2022
60.60 Standard published
Jun 7, 2023

Related project

Adopted from FprEN ISO 12179

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