Withdrawn
Describes profiles and the general structure of contact (stylus) instruments for measuring surface roughness and waviness. Specifies the properties of the instrument which influence profile evaluation. Replaces the first edition of ISO 3274:1975 and ISO 1880:1979.
WITHDRAWN
SSH EN ISO 3274:2004
95.99
Withdrawal of Standard
Dec 1, 2004
IN_DEVELOPMENT
prSSH EN ISO 25178-601:2025