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SSH EN IEC 62433-6:2020

EMC IC modelling - Part 6: Models of integrated circuits for pulse immunity behavioural simulation - Conducted pulse immunity modelling (ICIM-CPI)

Apr 26, 2021

General information

60.60     Apr 26, 2021

95.99    May 1, 2026

DPS

DPS/KT 7

European Norm

31.200     31.2  

English  

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Scope

IEC 62433-6:2020 describes the extraction flow for deriving an immunity macro-model of an Integrated Circuit (IC) against conducted Electrostatic Discharge (ESD) according to IEC 61000-4-2 and Electrical Fast Transients (EFT) according to IEC 61000-4-4.

The model addresses physical damages due to overvoltage, thermal damage and other failure modes. Functional failures can also be addressed. This model allows the immunity simulation of the IC in an application. This model is commonly called "Integrated Circuit Immunity Model Conducted Pulse Immunity", ICIM-CPI.

This document provides:

- the description of ICIM-CPI macro-model elements representing electrical, thermal or logical behaviour of the IC.

- a universal data exchange format based on XML.

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PUBLISHED
SSH EN IEC 62433-6:2020
60.60 Standard published
Apr 26, 2021

Related project

Adopted from EN IEC 62433-6:2020 IDENTICAL

Adopted from IEC 62433-6:2020 ED1 IDENTICAL