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SSH EN 62433-2:2017

EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)

Oct 24, 2018

General information

60.60     Sep 24, 2018

DPS

DPS/KT 7

European Norm

31.200     33.100.10  

English  

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Scope

IEC 62433-2:2008(E) specifies macro-models for ICs to simulate conducted electromagnetic emissions on a printed circuit board. The model is commonly called Integrated Circuit Emission Model - Conducted Emission (ICEM-CE). The ICEM-CE model can also be used for modelling an IC-die, a functional block and an Intellectual Property block (IP). The ICEM-CE model can be used to model both digital and analogue ICs. Basically, conducted emissions have two origins: - conducted emmissions through power supply terminals and ground reference structure; - conducted emmisions through input/output (I/O) terminals. The ICEM-CE model addresses those two types of origins in a single approach. This standard defines structures and components of the macro-model for EMI simulation taking into account the IC's internal activities. This standard gives general data, which can be implemented in different formats or languages such as IBIS, IMIC, SPICE, VHDL-AMS and Verilog. SPICE is however chosen as default simulation environment to cover all the conducted emissions. This standard also specifies requirements for information that shall be incorporated in each ICEM-CE model or component part of the model for model circulation, but description syntax is not within the scope of this standard.

Life cycle

PREVIOUSLY

WITHDRAWN
SSH EN 62433-2:2010

NOW

PUBLISHED
SSH EN 62433-2:2017
60.60 Standard published
Sep 24, 2018

Related project

Adopted from EN 62433-2:2017

Adopted from IEC 62433-2 Ed. 2.0 b