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SSH EN 60749-43:2017

Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans

Oct 24, 2018
95.99 Withdrawal of Standard   May 7, 2025

General information

95.99     May 7, 2025

DPS

DPS/KT 7

European Norm

31.080.01  

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Scope

IEC 60749-43:2017 gives guidelines for reliability qualification plans of semiconductor integrated circuit products (ICs). This document is not intended for military- and space-related applications.

Life cycle

NOW

WITHDRAWN
SSH EN 60749-43:2017
95.99 Withdrawal of Standard
May 7, 2025

REVISED BY

PUBLISHED
SSH EN IEC 63287-1:2021

Related project

Adopted from EN 60749-43:2017

Adopted from IEC 60749-43 Ed. 1.0 b