DS IEC/TS 62916:2017

Photovoltaic modules - Bypass diode electrostatic discharge susceptibility testing

Publication date: Oct 3, 2018

General information

Current stage: 60.60 Effective date: Sep 7, 2018

Originator: DPS

Owner: DPS/KT 6

Type: Technical Specification

ICS: 27.160

Languages: English

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Status: Published

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IEC TS 62916:2017(E) describes a discrete component bypass diode electrostatic discharge (ESD) immunity test and data analysis method. The test method described subjects a bypass diode to a progressive ESD stress test and the analysis method provides a means for analyzing and extrapolating the resulting failures using the two-parameter Weibull distribution function. It is the object of this document to establish a common and reproducible test method for determining diode surge voltage tolerance consistent with an ESD event during the manufacturing, packaging, transportation or installation processes of PV modules.

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PUBLISHED
DS IEC/TS 62916:2017
60.60 Standard published
Sep 7, 2018

Related project

Adopted from IEC/TS 62916 Ed. 1.0 en

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