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SSH EN 62435-2:2017

Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms

Apr 26, 2018

General information

60.60     Feb 13, 2018

DPS

DPS/KT 7

European Norm

31.020  

English  

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Scope

IEC 62435-2:2017 is related to deterioration mechanisms and is concerned with the way that components degrade over time depending on the storage conditions applied. This part also includes guidance on test methods that may be used to assess generic deterioration mechanisms. Typically, this part is used in conjunction with <a href="https://webstore.iec.ch/publication/31455">IEC 62435-1:2017 for any device long-term storage whose duration may be more than 12 months for product scheduled for long duration storage.

Life cycle

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PUBLISHED
SSH EN 62435-2:2017
60.60 Standard published
Feb 13, 2018

Related project

Adopted from EN 62435-2:2017