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SSH EN ISO 18452:2016

Fine ceramics (advanced ceramics, advanced technical ceramics) - Determination of thickness of ceramic films by contact-probe profilometer (ISO 18452:2005)

Mar 23, 2017

General information

60.60     Jan 24, 2017

DPS

DPS/KT 67

European Norm

81.060.30  

English  

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Published

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Scope

ISO 18452:2005 specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film thicknesses in the range of 10 nm to 10 000 nm.

Life cycle

PREVIOUSLY

WITHDRAWN
SSH EN 1071-1:2004

NOW

PUBLISHED
SSH EN ISO 18452:2016
60.60 Standard published
Jan 24, 2017

Related project

Adopted from EN ISO 18452:2016