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SSH ISO 17470:2014

Microbeam analysis — Electron probe microanalysis — Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry

Nov 16, 2016

General information

60.60     Jul 12, 2016

DPS

DPS/KT 233

International Standard

71.040.99  

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Scope

ISO 17470:2014 gives guidance for the identification of elements and the investigation of the presence of specific elements within a specific volume (on a μm3 scale) contained in a specimen, by analysing X-ray spectra obtained using wavelength dispersive X-ray spectrometers on an electron probe microanalyser or on a scanning electron microscope.

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PUBLISHED
SSH ISO 17470:2014
60.60 Standard published
Jul 12, 2016

Related project

Adopted from ISO 17470:2014