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SSH IEC 60747-14-1:2010

Semiconductor devices - Part 14-1: Semiconductor sensors - Generic specification for sensors

Nov 16, 2016

General information

60.60     Jul 6, 2016

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DPS/KT 7

International Standard

31.080.01  

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Scope

IEC 60147-14-1:2009 describes general items concerning the specifications for sensors, which are the basis for specifications given in other parts of this series for various types of sensors. Sensors described in this standard are basically made of semiconductor materials, however, the statements made in this standard are also applicable to sensors using materials other than semiconductor, for example dielectric and ferroelectric materials. The major changes with regard to the previous edition are as follows: a) Title change from "Semiconductor sensors - General and classification" to "Semiconductor sensors - Generic specification for sensors"; b) Clause 3 has been divided into three Clauses 3, 4 and 5; c) Added new terms from IEC 60747-14-5; d) Added a new Clause relating to Quality assessment procedures; e) Added a Bibliography; f) Added a new Annex for the sampling procedure.

Life cycle

NOW

PUBLISHED
SSH IEC 60747-14-1:2010
60.60 Standard published
Jul 6, 2016

Related project

Adopted from IEC 60747-14-1:2010 ED2 IDENTICAL

Adopted from IEC 60747-14-1 Ed. 2.0 b