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SSH EN 60749-42:2014

Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage

May 13, 2015

General information

60.60     Jan 8, 2015

DPS

DPS/KT 7

European Norm

31.080.01  

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Scope

IEC 60749-42:2014 provides a test method to evaluate the endurance of semiconductor devices used in high temperature and high humidity environments. This test method is used to evaluate the endurance against corrosion of the metallic interconnection of chips of semiconductor devices contained in plastic moulded and other types of packages. It is also used as a means of accelerating the leakage phenomena due to the moisture penetration through the passivation film and as a pre-conditioning for various kinds of tests.

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PUBLISHED
SSH EN 60749-42:2014
60.60 Standard published
Jan 8, 2015

Related project

Adopted from EN 60749-42:2014