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SSH EN 62215-3:2013

Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method

May 13, 2014

General information

60.60     Feb 3, 2014

DPS

DPS/KT 7

European Norm

31.200  

English  

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Scope

IEC 62215-3:2013 specifies a method for measuring the immunity of an integrated circuit (IC) to standardized conducted electrical transient disturbances. The disturbances, not necessarily synchronized to the operation of the device under test (DUT), are applied to the IC pins via coupling networks. This method enables understanding and classification of interaction between conducted transient disturbances and performance degradation induced in ICs regardless of transients within or beyond the specified operating voltage range.

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PUBLISHED
SSH EN 62215-3:2013
60.60 Standard published
Feb 3, 2014

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Adopted from EN 62215-3:2013