SSH EN 60749-27:2006/A1:2012
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
Nov 7, 2013
General information
60.60
Nov 7, 2013
DPS
DPS/KT 7
European Norm
31.080.01
English
Life cycle
NOW
PUBLISHED
SSH EN 60749-27:2006/A1:2012
60.60
Standard published
Nov 7, 2013
Related project
Adopted from
EN 60749-27:2006/A1:2012
Adopted from
IEC 60749-27 Amd.1 Ed. 2.0 b