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SSH IEC 60749-18:2002

Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)

Dec 5, 2011
95.99 Withdrawal of Standard   Feb 18, 2020

General information

95.99     Feb 18, 2020

DPS

DPS/KT 7

International Standard

31.080.01  

English  

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Scope

Provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 gamma ray source. Proposes an accelerated annealing test for estimating low dose rate ionizing radiation effects on devices. This annealing test is important for low dose rate or certain other applications in which devices may exhibit significant time-dependent effects. It is intended for military- and space-related applications.

Life cycle

NOW

WITHDRAWN
SSH IEC 60749-18:2002
95.99 Withdrawal of Standard
Feb 18, 2020

REVISED BY

PUBLISHED
SSH IEC 60749-18:2019

Related project

Adopted from IEC 60749-18:2002 ED1