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SSH IEC 60749-13:2002

Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere

Nov 25, 2011
95.99 Withdrawal of Standard   May 7, 2019

General information

95.99     May 7, 2019

DPS

DPS/KT 7

International Standard

31.080.01  

English  

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Scope

Describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive. The contents of the corrigendum of August 2003 have been included in this copy.

Life cycle

NOW

WITHDRAWN
SSH IEC 60749-13:2002
95.99 Withdrawal of Standard
May 7, 2019

REVISED BY

PUBLISHED
SSH EN IEC 60749-13:2018

Related project

Adopted from IEC 60749-13 Ed. 1.0 b