SSH IEC 60749-11:2002/COR2:2003
Corrigendum 2 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
Nov 25, 2011
General information
60.60
Nov 25, 2011
DPS
DPS/KT 7
International Standard
31.080.01
English
Scope
Modification of the validity date: now put at 2007.
Life cycle
NOW
PUBLISHED
SSH IEC 60749-11:2002/COR2:2003
60.60
Standard published
Nov 25, 2011
Related project
Adopted from
IEC 60749-11 Ed. 1.0 b Cor.2