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SSH IEC 60749-11:2002/COR1:2003

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method

Publication date: Nov 25, 2011

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Current stage: 60.60 Effective date: Nov 25, 2011

Originator: DPS

Owner: DPS/KT 7

Type: International Standard

Languages: English

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Status: Published

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PUBLISHED
SSH IEC 60749-11:2002/COR1:2003
60.60 Standard published
Nov 25, 2011

Related project

Adopted from IEC 60749-11:2002/COR1:2003 ED1 IDENTICAL

Adopted from IEC 60749-11 Ed. 1.0 b Cor.1