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SSH IEC 60749-11:2002

Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method

Nov 25, 2011

General information

60.60     Nov 25, 2011

DPS

DPS/KT 7

International Standard

31.080.01  

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Scope

Defines the rapid change of temperature test method and the two-fluid-bath method. This test method may also be used, employing fewer cycles, to test the effect of immersion in heated liquids that are used for the purpose of cleaning devices. This test is applicable to all semiconductor devices. It is considered destructive unless otherwise detailed in the relevant specification. The contents of the corrigenda of January 2003 and August 2003 have been included in this copy.

Life cycle

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PUBLISHED
SSH IEC 60749-11:2002
60.60 Standard published
Nov 25, 2011

Related project

Adopted from IEC 60749-11:2002 ED1 IDENTICAL

Adopted from IEC 60749-11 Ed. 1.0 b