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SSH IEC 60749-10:2002

Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock

Nov 25, 2011
95.99 Withdrawal of Standard   Sep 12, 2023

General information

95.99     Sep 12, 2023

DPS

DPS/KT 7

International Standard

31.080.01  

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Scope

Describes a shock test intended to determine the suitability of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result of suddenly applied forces or abrupt changes in motion produced by rough handling, transportation, or field operation. Shock of this type may disturb operating characteristics, particularly if the shock pulses are repetitive. This is a destructive test. It is normally applicable to cavity-type packages. The contents of the corrigendum of August 2003 have been included in this copy.

Life cycle

NOW

WITHDRAWN
SSH IEC 60749-10:2002
95.99 Withdrawal of Standard
Sep 12, 2023

REVISED BY

PUBLISHED
SSH EN IEC 60749-10:2022

Related project

Adopted from IEC 60749-10 Ed. 1.0 b