SSH EN 60749-23:2004/A1:2011
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
Nov 25, 2011
General information
60.60
Nov 25, 2011
DPS
DPS/KT 7
European Norm
31.080.01
English
Life cycle
NOW
PUBLISHED
SSH EN 60749-23:2004/A1:2011
60.60
Standard published
Nov 25, 2011
Related project
Adopted from
EN 60749-23:2004/A1:2011
Adopted from
IEC 60749-23 Amd.1 Ed. 1.0 b