SSH EN 60749-19:2003/A1:2010
Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength
May 27, 2011
General information
60.60
May 27, 2011
DPS
DPS/KT 7
European Norm
31.080.01
English
Life cycle
NOW
PUBLISHED
SSH EN 60749-19:2003/A1:2010
60.60
Standard published
May 27, 2011
Related project
Adopted from
EN 60749-19:2003/A1:2010
Adopted from
IEC 60749-19 Amd.1 Ed. 1.0 b