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SSH EN 60749-20-1:2009

Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat

Oct 29, 2009

General information

60.60     Jan 1, 2009

DPS

DPS/KT 7

European Norm

31.080.01  

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Scope

IEC 60749-20-1:2009 applies to all non-hermetic SMD packages which are subjected to reflow solder processes and which are exposed to the ambient air. The purpose of this document is to provide SMD manufacturers and users with standardized methods for handling, packing, shipping, and use of moisture/reflow sensitive SMDs which have been classified to the levels defined in IEC 60749-20. These methods are provided to avoid damage from moisture absorption and exposure to solder reflow temperatures that can result in yield and reliability degradation. By using these procedures, safe and damage-free reflow can be achieved, with the dry packing process, providing a minimum shelf life capability in sealed dry-bags from the seal date.

Life cycle

NOW

PUBLISHED
SSH EN 60749-20-1:2009
60.60 Standard published
Jan 1, 2009

Related project

Adopted from EN 60749-20-1:2009

Adopted from IEC 60749-20-1 Ed. 1.0 b