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SSH EN 60749-39:2006

Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components

Jun 6, 2008
95.99 Withdrawal of Standard   May 7, 2025

General information

95.99     May 7, 2025

DPS

DPS/KT 7

European Norm

31.080.01  

English  

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Scope

Detailed the procedures for the measurement of the characteristic properties of moisture diffusivity and water solubility in organic materials used in the packaging of semiconductor components. These two material properties are important parameters for the effective reliability performance of plastic packaged semiconductors after exposure to moisture and being subjected to high-temperature solder reflow.

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NOW

WITHDRAWN
SSH EN 60749-39:2006
95.99 Withdrawal of Standard
May 7, 2025

REVISED BY

PUBLISHED
SSH EN IEC 60749-39:2022

Related project

Adopted from EN 60749-39:2006

Adopted from IEC 60749-39 Ed. 1.0 b